( ESNUG 213 Item 7 ) ---------------------------------------------- [4/5/95]

From: sbkim@rwasic44.aud.alcatel.com (Scott B. Kim)
Subject: Test Compiler & Bidirectional Ports During SCAN

John,

I would like to know if I can make Test Compiler understand that all the
bidirectional pins in my design are configured to be input during the scan
test.  Our test control circuit was designed to force all the bidirectional
pins as input during scan mode; however, the Test Compiler treats these
pins as output.  

Due to this undesirable circumtance, we are constanly getting miscomparison
during scan check.  If anyone on ESNUG has any suggestions, please post them!

  - Scott Kim
    Alcatel
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