( ESNUG 305 Item 3 ) --------------------------------------------- [11/18/98]
From: [ Kenny from South Park ]
Subject: Test-Smart -- Avoids Test Compiler & Helps W/ Mentor's DFT Advisor
John, company politics says I stay anon.
Synopsys has the ability to do a "Test-Smart" compile. The command to
configure this is:
set_scan_configuration -style multiplexed_flip_flop
Valid commands for this are "multiplexed_flip_flop", "clocked_scan", "lssd",
"aux_clock_lssd", and "combinational", but nobody ever uses any of them but
"multiplexed_flip_flop". The neat thing about this command it that it
DOESN'T grab the "Test-Compiler" license. So you can use it to feed the
Mentor Graphics DFT Advisor (which is what most of us actually use).
What does this REALLY do? According to Synopsys:
"Test-Smart Compile prevents the use of functional cells with no scan
equivalents during mapping. This is accomplished by restricting the
set of cells that can be used by optimization."
This works by reading an attribute in your library which list the cells with
scan attributes. Note that some scan cells have scan attributes.
Thus a "dont_use" on scan cells and pawing through the library for cells the
Mentor's DFT Advisor can deal with is no longer necessary.
- [ Kenny from South Park ]
|
|
