( ESNUG 306 Item 5 ) ---------------------------------------------- [12/3/98]
Subject: ( ESNUG 305 #3 ) Test-Smart Avoids TC; Helps Mentor's DFT Advisor
> Synopsys has the ability to do a "Test-Smart" compile. The command to
> configure this is:
>
> set_scan_configuration -style multiplexed_flip_flop
>
> Valid commands are "multiplexed_flip_flop", "clocked_scan", "lssd",
> "aux_clock_lssd", and "combinational", but nobody ever uses any of them
> but "multiplexed_flip_flop". The neat thing about this command it that it
> DOESN'T grab the "Test-Compiler" license. So you can use it to feed the
> Mentor Graphics DFT Advisor (which is what most of us actually use).
>
> - [ Kenny from South Park ]
From: William Liao <wliao@vadem.com>
Hi, John,
I guess where I work is an exception. We use Test Compiler to create LSSD
scan chains and test vectors. I've heard that a number of other major
design centers like IBM and SUN Microsystems also use LSSD. I've written
an internal paper on the subject, and submitted an abstract/outline
to SNUG Tech Committee. If I am lucky, I'll present the paper in SNUG99.
- William H. Liao
Vadem
PS: Have you seen Clio? It's a neat WindowsCE subnotebook with amazing
battery life! Yea, this is a shameless plug for a Vadem product. But
I thought I'd try anyway seeing as to how often I write in ESNUG! :)
|
|
