( ELSE 06 Item 23 ) -------------------------------------------- [ 06/23/06 ]

Subject: Calibre DFM, Aprio, KLA-Tencor, Nannor, ChipMD, LogicVision

MIKE AND ATUL -- To get a first look at the exotic world of DFM, I asked the
CEOs of two DFM start-ups what they specifically thought about their niche
and their rivals.  It resulted in ESNUG 453:

    ( ESNUG 453 Subjects ) ------------------------------- [03/01/06]

      Item  1: Mike and Atul go to the DFM movies
      Item  2: Mentor, Cadence, Synopsys, Magma, PDF Solutions
      Item  3: Aprio, Clear Shape, KLA-Tencor, Brion, Invarium
      Item  4: Luminescent, Takumi, Blaze DFM, Nannor, Sigma-C
      Item  5: Ponte, Prediction, SDS, Pyxis, Pulsic
      Item  6: Praesagus, Sagantec, TSMC, SoftJin
      Item  7: ChipMD, Silicon Dimensions, LogicVision
      Item  8: and if you're enraged

And, of course, there were the user comments I got from this survey, too.


    Calibre DFM tools are used.  Synopsys tools have been evaluated and
    have some promise.

        - [ An Anon Engineer ]


    Calibre DFM works for us.  Of all the rest, only Synopsys appears to
    have a roadmap to get to a complete solution, but it's not there yet.

        - [ An Anon Engineer ]


    Design for Yield

    The two big issues here are:

       1. There is no standard for transmitting yield information from a
          foundry for someone trying to improve their yield.
       2. This is the most sensitive information that foundries possess
          so they will demand some sort of encryption.

    A number of tools would gladly accept foundry specific information and
    change the layout in keeping with their utility.  Currently there is no
    way universal method to do that and I'm not aware of anyone working on a
    standard.  For example, Synopsys IC Compiler measures "critical area"
    (the total area where a particle could cause a failure) and tries to
    minimize it.  They said they would gladly take more exact, foundry
    specific information but can't get any.  Mentor is also working on some
    standard encrypted format but currently has to let the user make guesses.

    Mentor's Calibre is a major player in the design for yield area and most
    other vendors were comparing their tools to this.  Their tool does full
    analysis and limited modification to improve yield.

    Aprio sells DFM software to do the OPC and RET, simulate it and fix
    small areas.  They claim it is similar speed-wise to Calibre.

    Nannor sells a tool that does fixes based on recommended rules.  It can
    do things like redundant vias, line end spacing changes, avoidance of
    stacked vias, and wire spreading.  The user can also specify new rules
    using the Tcl interface.

    Ponte sells a tool that analyzes yield detractors.  The input is GDSII
    or LEF/DEF plus fab information, and the output is detailed yield
    information.  It gives yield by layer, highlights worst yielding nets,
    etc.  They can characterize libraries and IP.

    CommandCAD sells fast pattern matching software that looks for yield
    detractors that might still pass DRC checks.  They say they can spot
    areas where OPC will have problems.  They emphasized that their approach
    is 2D, unlike 1 dimensional DRC checks.  They get yield information
    from the fab (format??).

    KLA has a tool called Design Scan that allows full chip process window
    simulation.  The input is the mask data after OPC.  They claim that in
    only 2-4 hours they can simulate an 8mm by 8mm die over 35 focusing
    exposure conditions.  They have an older tool called Prolith that is
    aimed more at simulation of individual cells.

    Sigma-C sells what they claim is the only tool to do 3D resist sim.
    The depth of focus of modern equipment is extremely small, so 3D
    simulation, which models how the resist is developed throughout its
    height, can spot problems that normal 2D simulation can't.  The problem
    is that is it amazingly CPU intensive.  Currently their tool can only
    do a small portion of a cell.  A new product due out later should be
    able to do an entire standard cell.

    ChipMD sells tools that do Design for Yield (at a circuit level, not a
    mask level) for analog devices.  One does circuit optimization for
    yield using Monte Carlo simulation, and one does worst case analysis
    without using Monte Carlo methods.  Both create SPICE scripts for your
    own simulator (they don't provide a simulator).

    Clear Shape is a DFM company that had no products out yet as of DAC.

    The Sagantec folks said they are getting lots of interest in their
    Design for Manufacturability stuff.  They say their customers have
    working silicon at 65 nanometers and their tools are being used on
    a 45 nanometer design.  Their tool does things like doubling vias and
    increasing overlap around vias as well as fixing DRC violations.
    They also have a tool called Anaconda for analog checking.  The user
    can specify properties on a schematic (like symmetry) and the tool
    checks for those properties. 

    Rubicad again did not attend DAC.  I heard that at least last year they
    just didn't think it was worth the money.

        - John Weiland of Intrinsix Corp.


    Sagantec are useful for process migration, but it starts choking on
    advanced technologies.  The ClearShape and Blaze DFM simulators look
    interesting.

        - [ An Anon Engineer ]


    LogicVision adds value to some extent but it does require a lot of
    understanding of new concepts and some changes to the flow.  This is
    OK for large companies, but for smaller companies, this may be quite
    a deterrent.

        - [ An Anon Engineer ]
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