In his keynote address, Wally Rhines talks about scan, ATPG, BIST,
  test pattern ordering, cost of test, Janusz Rajski, don't cares,
  coverage, at speed, stuck at, compression, transition and bridging
  faults, cycles-per-test vs. tests-per-cycle, 70% of design is test,
  design reuse, power, multiple clocks, server farms, GRID, brute
  force, FPGA prototyping, emulation, assertions, late designs, RTL
  simulators, intelligent testbenches, constrained random, dynamic
  formal, TLM, abstractions and his Q&A follow-up.

        See http://www.deepchip.com/videos/wally08.fhtml

  After viewing his keynote, feel free to send your reactions.  - John

  P.S. No registration, no sign up, my videos are now for all to see!